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An N ‐pattern display for an SSD X‐ray diffractometer
Author(s) -
Hosoya S.,
Sakamaki T.,
Nakano Y.,
Fukamachi T.
Publication year - 1982
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889882011819
Subject(s) - diffractometer , diffraction , crystallography , x ray , materials science , detector , solid state , optics , x ray crystallography , physics , chemistry , scanning electron microscope , engineering physics
The present paper describes a new type of display for X‐ray diffraction patterns which corresponds to the N pattern well known in electron diffraction. This has been realized by an ω ‐circle SSD (solid‐state detector) diffractometer equipped with a CRT display all operated by a small computer. The merits are described of its possible applications.