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Laue photography of fine crystalline particles
Author(s) -
Steinberger I. T.,
Asaf U.,
Graeff W.,
Kalman Z. H.
Publication year - 1982
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889882011790
Subject(s) - crystallite , synchrotron radiation , materials science , optics , substrate (aquarium) , x ray , radiation , electron microscope , crystallography , mineralogy , chemistry , physics , geology , metallurgy , oceanography
An experimental method is described for the determination of crystallite dimensions in polycrystalline materials. It is based on studying the geometry of streaks that appear in powder photographs taken with white X‐ray radiation. A detailed analysis is presented that includes a differentiation between these streaks and somewhat similar streaks due to asterism. Results by synchrotron radiation from powder samples of various materials are discussed and compared with the crystallite dimensions obtained by other methods. It is demonstrated that the method is largely complementary to measurements by electron microscopy and that it is particularly useful for the determination of the thickness distribution of thin (0.005–0.5 μm) platelets, oriented parallel to the substrate.