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Determination of the correlation function directly from slit‐smeared small‐angle X‐ray scattering curves
Author(s) -
Gerber T.,
Walter G.,
Kranold R.
Publication year - 1982
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889882011686
Subject(s) - bessel function , series (stratigraphy) , correlation function (quantum field theory) , function (biology) , scattering , physics , optics , correlation , slit , zero (linguistics) , mathematical analysis , small angle scattering , computational physics , geometry , mathematics , quantum mechanics , linguistics , paleontology , philosophy , evolutionary biology , dielectric , biology
A simple technique has been developed for calculating the correlation function directly from small‐angle X‐ray scattering curves obtained with an `infinitely long' primary beam profile. The method is based on expanding the correlation function in a series of zero‐order Bessel functions of the first kind, where the coefficients of the series are proportional to the intensities of the measured curve. The correlation function thus is represented by an analytical expression and can be calculated easily.