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A fail‐safe design for X‐ray safety shutters
Author(s) -
Cramer W. E.,
Guggenheim S.,
Port E. A.
Publication year - 1982
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889882011613
Subject(s) - fail safe , computer science , materials science , nuclear engineering , optics , engineering , reliability engineering , physics