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X‐ray line profile analysis of deformed Al
Author(s) -
Yuming W.,
Shansan L.,
Yenchin L.
Publication year - 1982
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889882011315
Subject(s) - debye , dislocation , diffraction , materials science , x ray , crystallography , line (geometry) , correctness , strain (injury) , condensed matter physics , physics , chemistry , optics , geometry , mathematics , algorithm , medicine
The Warren–Averbach profile analysis was modified to study the deformed state of Al. The X‐ray diffraction effect of dislocations locating on cell boundaries may be treated as `size broadening', while that of dislocations inside cells is `strain broadening', which may be treated with Wilkens's theory. X‐ray Debye profile measurement was performed on deformed, recovered and annealed samples of commercial pure Al. Some information concerning the dislocation glide systems and distribution as well as the differences between the deformed and recovered state were given by the Debye profile analysis. The results are in good agreement with those obtained by other authors, which prove the reliability and correctness of the method.