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High‐resolution time‐of‐flight powder diffractometer at the ZING‐P'' pulsed neutron source
Author(s) -
Jorgensen J. D.,
Rotella F. J.
Publication year - 1982
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889882011303
Subject(s) - powder diffractometer , diffractometer , time of flight , resolution (logic) , neutron , materials science , rietveld refinement , neutron source , flux (metallurgy) , optics , physics , nuclear physics , diffraction , computer science , scanning electron microscope , artificial intelligence , metallurgy
A high‐resolution time‐of‐flight powder diffractometer has been operated at Argonne's ZING‐P′ pulsed neutron source for over 2½ years. The diffractometer achieves Δd/d ≤ 3 × 10 −3 over a broad range of plane spacings. Even though the flux at the sample position is comparatively low due to the 18.37 m incident flight path, count rates competitive with typical two‐axis diffractometers are achieved because of large detector areas. A Rietveld refinement of data for a standard Al 2 O 3 sample gives results as good as or better than those obtained with the best two‐axis diffractometers.