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Application of the method of moments to X‐ray diffraction line profiles from paracrystals: Native cellulose fibres
Author(s) -
Mitra G. B.,
Mukherjee P. S.
Publication year - 1981
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889881009692
Subject(s) - paracrystalline , diffraction , distortion (music) , curvature , line (geometry) , materials science , physics , optics , chemistry , crystallography , mathematics , geometry , amplifier , optoelectronics , cmos
The `microparacrystallite size' and `distortion parameter' of delignified ramie, hemp and jute have been determined – with the assumption that these materials are paracrystalline in nature – with the second and fourth central moments of X‐ray diffraction line profiles. A new method of curvature correction has been developed. Background as well as non‐additivity corrections have also been accounted for. Theories of determining the `microparacrystallite size' and the `distortion parameter' from single reflections independently from each of these two central moments have been developed, and described. Determination of these two parameters for several directions in the samples studied have been based on the above work. It has been shown that, in conformity with the recent findings of Hosemann & Balta Calleja [ Ber. Bunsenges. Phys. Chem. (1980), 84 , 91], the larger the paracrystalline distortion the smaller is the `microparacrystallite size'.