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A theoretical consideration of the influence of surface profile on the measurement of stress using the X‐ray diffraction method
Author(s) -
Doig P.,
Flewitt P. E. J.
Publication year - 1981
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889881009461
Subject(s) - diffraction , materials science , stress (linguistics) , position (finance) , surface stress , x ray crystallography , optics , surface (topology) , x ray , crystallography , composite material , physics , chemistry , geometry , mathematics , surface energy , philosophy , linguistics , finance , economics
The measurement of stress on machined surfaces using the X‐ray diffraction method is discussed. The influence of surface profile on the diffracted peak position is evaluated and considered with respect to its effect on the accuracy of stress measurement.