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Diffraction by layer structures containing different kinds of layers and stacking faults
Author(s) -
Plançon A.
Publication year - 1981
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889881009424
Subject(s) - stacking , diffraction , formalism (music) , rod , reciprocal , reciprocal lattice , crystallography , materials science , geometry , optics , physics , molecular physics , condensed matter physics , chemistry , mathematics , nuclear magnetic resonance , medicine , art , musical , linguistics , philosophy , alternative medicine , pathology , visual arts
A description is given of a mathematical formalism which allows the study of diffraction by stacks which contain, simultaneously or not, (i) layers of different kinds, (ii) different translations or rotations between layers and (iii) different thicknesses. The formalism allows the calculation of intensities for all the hkl reflections or ( h,k ) reciprocal rods, and not just the 00 l reflections. It accounts for an S th‐neighbour interaction ( S ≥1).