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Preliminary investigation of a new X‐ray film
Author(s) -
Abrahamsson S.,
Lindqvist O.,
Sjölin L.,
Wlodawer A.
Publication year - 1981
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s002188988100931x
Subject(s) - materials science , optics , diffraction , x ray , radiation , x ray crystallography , physics
A new X‐ray film, produced by CEAVERKEN in Sweden, has recently become available. Some properties of this film have been compared to three other films commonly used in the recording of X‐ray diffraction intensities (Agfa T4, Kodak No‐screen, Ilford Industrial G). The linearity of CEA film has been found to be similar to that for Agfa and Ilford. The speed of the new film is about 10% lower than Agfa or Kodak, and the film factor was measured to be 2.9 for Cu K α radiation. The background level is significantly lower than on the other three films investigated. This combination of properties makes CEA film suitable for routine collection of X‐ray diffraction data.