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Die sin ι i /sin ι j ‐Methode für die Bestimmung von Gitterparametern
Author(s) -
Vavrda J.
Publication year - 1981
Publication title -
journal of applied crystallography
Language(s) - German
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889881009126
Subject(s) - reciprocal , reciprocal lattice , die (integrated circuit) , simple (philosophy) , algebraic number , lattice (music) , simple cubic lattice , algebraic equation , physics , crystallography , mathematical physics , materials science , mathematics , chemistry , mathematical analysis , nanotechnology , quantum mechanics , diffraction , philosophy , statistics , linguistics , epistemology , nonlinear system , acoustics , monte carlo method
By solving a system of linear equations, the reciprocal‐lattice parameters can be determined. They can be calculated for all crystal systems in a simple algebraic way.