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An assessment of instrumental parameters which control the accuracy of stress measurement using the X‐ray diffractometer method
Author(s) -
Doig P.,
Lonsdale D.,
Flewitt P. E. J.
Publication year - 1981
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s002188988100890x
Subject(s) - diffractometer , systematic error , stress (linguistics) , observational error , x ray , accuracy and precision , materials science , computer science , optics , physics , mathematics , statistics , scanning electron microscope , linguistics , philosophy
The sources of systematic error in the X‐ray diffractometer method of stress measurement are discussed. The errors in stress measurement and correction procedures for their elimination are described and quantitatively assessed.