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A device for accurate single‐crystal X‐ray diffraction investigations at non‐ambient temperatures: 83–1120 K
Author(s) -
Hong S.H.,
Åsbrink S.
Publication year - 1981
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889881008649
Subject(s) - inert gas , diffractometer , tube (container) , liquid nitrogen , crystal (programming language) , materials science , single crystal , diffraction , analytical chemistry (journal) , evaporator , atmosphere (unit) , chemistry , crystallography , optics , crystal structure , composite material , thermodynamics , physics , chromatography , heat exchanger , organic chemistry , computer science , programming language
A device is described which uses liquid nitrogen to generate a cold or hot gas stream which is blown directly onto the crystal mounted on an X‐ray diffractometer. With a specially constructed high‐vacuum (< 1.3 × 10 –5 Pa) jacketed silica Dewar tube, it can operate between 83 and 1120 K with a stability over long time periods of ±¼ K below and ± 1 K above ambient temperature. In the latter case the short‐time stability is ±¼ K for hours. It gives an inert atmosphere at elevated temperatures and allows extensive data collection for the accurate determination of crystal structures. The evaporator, the automatic refilling system and the silica Dewar tube are described.