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Crystal subgrain misorientations observed by X‐ray topography in reflection
Author(s) -
Armstrong R. W.,
Boettinger W. J.,
Kuriyama M.
Publication year - 1980
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889880012472
Subject(s) - stereographic projection , misorientation , reflection (computer programming) , crystal (programming language) , dislocation , diffraction , optics , crystallography , geometry , materials science , grain boundary , physics , microstructure , chemistry , mathematics , computer science , programming language
Based on the principles of conservation of momentum and energy for X‐ray diffraction, a vector description is obtained for the displacement of adjacent subgrain images in reflection topographs. The analysis includes, in addition to those crystal parameters defining the misorientation at a subgrain boundary, the combined effects of (horizontal and vertical) divergence in the incident X‐ray beam and of the position where the X‐ray images are recorded. The vector description is matched with a stereographic projection method of analysis for describing the subgrain misorientations. These total considerations are applied to the characterization of subgrain boundaries grown into a nickel single‐crystal solidified along [010], including specification of the dislocation structure within the boundaries.