Premium
New methods of X‐ray diffraction spectrometry. I. Image formation in curved crystals
Author(s) -
Bremer J.,
Sørum H.
Publication year - 1980
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889880012289
Subject(s) - bent molecular geometry , reflection (computer programming) , crystal (programming language) , diffraction , bragg's law , optics , point source , focus (optics) , radiation , x ray , line (geometry) , point (geometry) , materials science , physics , spectral line , single crystal , crystallography , chemistry , computer science , geometry , mathematics , astronomy , composite material , programming language
Image formation in a dispersive system, consisting essentially of a perfect cylindrically bent crystal in association with a point source, has been studied both for transmission and reflection. The Laue and Bragg conditions have been calculated together with the dispersive power. The treatment has been extended to include two crystals. In the single‐crystal case and also for most versions of two‐crystal combinations a point or line focus is required to obtain highly resolved spectra. A few versions of the two‐crystal arrangement can be made to be focusing, thereby enabling the use of an extended radiation source.