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Small‐angle X‐ray data processing for planar multilayered structures. 2. Experimental determination of the parameters for retinal photoreceptors and sarcoplasmic reticulum membranes
Author(s) -
Worthington C. R.,
Worthington A. R.,
Wang S. K.
Publication year - 1980
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889880012058
Subject(s) - collimated light , pinhole (optics) , membrane , endoplasmic reticulum , planar , fourier transform , diffraction , optics , materials science , retinal , chemistry , biophysics , physics , biology , computer science , biochemistry , computer graphics (images) , quantum mechanics , laser
The Fourier‐transform values are obtained by multiplying the integrated intensities of X‐ray patterns by the correction factor C ( h ). The problem of determining C ( h ) for biological specimens which have a planar multi‐layered structure and which remain stationary during the X‐ray experiment is treated. Parameters for evaluating C ( h ) can be obtained from pinhole (limited slit) collimated small‐angle X‐ray diffraction patterns. Two biological structures, namely retinal photoreceptors and sarcoplasmic reticulum membranes have been studied. Correction factors for these structures have been experimentally measured.