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The application of asymmetric Bragg reflections in the Bond method of measuring lattice parameters
Author(s) -
Wołcyrz M.,
Pietraszko A.,
Łukaszewicz K.
Publication year - 1980
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889880011430
Subject(s) - bragg's law , asymmetry , lattice (music) , materials science , lattice constant , optics , silicon , boron , condensed matter physics , molecular physics , optoelectronics , physics , diffraction , quantum mechanics , acoustics , nuclear physics
Asymmetric Bragg reflections have been applied in precise lattice‐parameter determinations of thin, near‐surface single‐crystal layers. The measurements were performed by the Bond method which combines considerable simplicity and high accuracy. The reflection asymmetry greatly reduces the penetration depth of X‐rays but requires a careful application of proper corrections. An example is described of the measurement of lattice‐parameter changes in the near‐surface layer of a silicon crystal doped with boron.