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On the geometrical conditions for recording X‐ray topographs of large crystal slices
Author(s) -
LindegaardAndersen A.,
Christiansen C.,
Zsoldos L.
Publication year - 1980
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889880011417
Subject(s) - x ray , crystal (programming language) , wavelength , optics , radiation , transmission (telecommunications) , scale (ratio) , physics , sample (material) , materials science , computational physics , geometry , mathematics , computer science , telecommunications , quantum mechanics , programming language , thermodynamics
Geometrical aspects of large‐scale transmission X‐ray topography with Kα 1 radiation have been considered. It is shown that the height of a crystal slice which can be effectively recorded is given as H eff = 2 L ( Δλ / λ ) 1/2 , where L is the source‐to‐sample distance and Δλ is the wavelength difference for the Kα doublet. A geometrical scheme termed the moving‐slit simulation has been developed to examine the influence of various experimental parameters such as the widths of source and slits, the involved distances and the adjustment of the sample. The usefulness of this scheme is demonstrated experimentally.