Premium
X‐ray diffraction profiles from single crystals of Cu–Ge alloy containing heavily faulted regions
Author(s) -
Takama T.,
Yokota N.,
Sato S.
Publication year - 1979
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889879013236
Subject(s) - diffraction , deformation (meteorology) , intensity (physics) , crystallography , materials science , single crystal , alloy , plane (geometry) , x ray , sequence (biology) , x ray crystallography , geometry , condensed matter physics , physics , optics , chemistry , composite material , mathematics , biochemistry
Intensity profiles of diffuse streaks along [111] were accurately measured for heavily faulted regions in deformed specimens. They often showed two or three broad peaks and differ remarkably from Paterson's [ J. Appl. Phys. (1952). 23 , 805–811] profiles ( Reichweite s = 1), but are in fairly good agreement with Kakinoki's [ Acta Cryst. (1967). 23 , 875–885] profile of s = 2 with the sequence probabilities α 1 = 0.45–0.85 and α 2 = 0–0.1. This means that the deformation (intrinsic) faults are produced more easily on every other (111) plane than on successive planes. A model which shows the distribution of the deformation faults is constructed by a computer simulation. A detailed study using Kakinoki's theory with s = 3 shows a better fit with the experimental profile.