Improvement of high‐angle double‐crystal X‐ray diffractometry (HADOX) for measuring temperature dependence of lattice constants. II. Practice | Zendy

Ohama N. | Zendy; Sakashita H. | Zendy; Okazaki A. | Zendy

Premium

Improvement of high‐angle double‐crystal X‐ray diffractometry (HADOX) for measuring temperature dependence of lattice constants. II. Practice

Author(s) -

Ohama N.,

Sakashita H.,

Okazaki A.

Publication year - 1979

Publication title -

journal of applied crystallography

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.429

H-Index - 162

ISSN - 1600-5767

DOI - 10.1107/s0021889879013017

Subject(s) - thermal expansion , diffractometer , lattice constant , silicon , materials science , lattice (music) , x ray , crystal structure , thermal , crystallography , thermodynamics , chemistry , optics , diffraction , physics , acoustics , metallurgy

A HADOX diffractometer for measuring temperature dependence of lattice constants with a relative accuracy to one part in 10 7 has been designed and constructed. Details of the structure and of the procedures for alignment and measurement are given together with the result of a performance test with silicon crystals. The observed value of the linear expansion coefficient of silicon is (2.72 ± 0.02) × 10 −6 K −1 at 310 K; this is in good agreement with that previously given by a more accurate thermal expansion experiment and shows the applicability of this technique.

This content is not available in your region!

Continue researching here.

Having issues? You can contact us here

Accelerating Research