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Improvement of high‐angle double‐crystal X‐ray diffractometry (HADOX) for measuring temperature dependence of lattice constants. II. Practice
Author(s) -
Ohama N.,
Sakashita H.,
Okazaki A.
Publication year - 1979
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889879013017
Subject(s) - thermal expansion , diffractometer , lattice constant , silicon , materials science , lattice (music) , x ray , crystal structure , thermal , crystallography , thermodynamics , chemistry , optics , diffraction , physics , acoustics , metallurgy
A HADOX diffractometer for measuring temperature dependence of lattice constants with a relative accuracy to one part in 10 7 has been designed and constructed. Details of the structure and of the procedures for alignment and measurement are given together with the result of a performance test with silicon crystals. The observed value of the linear expansion coefficient of silicon is (2.72 ± 0.02) × 10 −6 K −1 at 310 K; this is in good agreement with that previously given by a more accurate thermal expansion experiment and shows the applicability of this technique.