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Accurate X‐ray determination of the lattice parameters and the thermal expansion coefficients of VO 2 near the transition temperature
Author(s) -
Kucharczyk D.,
Niklewski T.
Publication year - 1979
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889879012711
Subject(s) - thermal expansion , atmospheric temperature range , lattice (music) , materials science , thermodynamics , phase transition , thermal , lattice constant , x ray , transition temperature , transition metal , condensed matter physics , chemistry , diffraction , physics , optics , superconductivity , acoustics , biochemistry , catalysis
Accurate lattice parameters and thermal expansion coefficients of the low‐ and high‐temperature phases of VO 2 have been determined from measurements on single crystals with the Bond method [ Acta Cryst. (1960), 13 , 814–818]. The transition from a semi‐conducting to a metallic phase occurs over a temperature range of 0.1 K with a corresponding volume change of 0.044%.