Accurate X‐ray determination of the lattice parameters and the thermal expansion coefficients of VO 2  near the transition temperature | Zendy

Kucharczyk D. | Zendy; Niklewski T. | Zendy

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Accurate X‐ray determination of the lattice parameters and the thermal expansion coefficients of VO 2 near the transition temperature

Author(s) -

Kucharczyk D.,

Niklewski T.

Publication year - 1979

Publication title -

journal of applied crystallography

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.429

H-Index - 162

ISSN - 1600-5767

DOI - 10.1107/s0021889879012711

Subject(s) - thermal expansion , atmospheric temperature range , lattice (music) , materials science , thermodynamics , phase transition , thermal , lattice constant , x ray , transition temperature , transition metal , condensed matter physics , chemistry , diffraction , physics , optics , superconductivity , acoustics , biochemistry , catalysis

Accurate lattice parameters and thermal expansion coefficients of the low‐ and high‐temperature phases of VO 2 have been determined from measurements on single crystals with the Bond method [ Acta Cryst. (1960), 13 , 814–818]. The transition from a semi‐conducting to a metallic phase occurs over a temperature range of 0.1 K with a corresponding volume change of 0.044%.

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