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Diffracted beam–transmitted beam Borrmann X‐ray topography in copper. A novel method of stereo depth topography
Author(s) -
Hamill G. P.,
Vreeland T.
Publication year - 1979
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889879012668
Subject(s) - diffraction , optics , beam (structure) , copper , crystal (programming language) , materials science , absorption (acoustics) , physics , computer science , metallurgy , programming language
The observed depths of dislocations, as measured from the exit surface of a copper single‐crystal, are within a region of the crystal where μd , the kinematic linear absorption coefficient times the depth, is less than or approximately equal to unity. Splitting of the Borrmann wave into its diffracted and transmitted beam components is indicated in relatively perfect portions of the crystal near the exit surface.