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Applications of a solid‐state detector on a modern single‐crystal X‐ray diffractometer
Author(s) -
Mullica D. F.,
Beall G. W.,
Milligan W. O.,
Oliver J. D.
Publication year - 1979
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889879012449
Subject(s) - diffractometer , scintillator , detector , materials science , single crystal , diffraction , crystallography , scintillation , analytical chemistry (journal) , crystal (programming language) , x ray , chemistry , crystal structure , optics , physics , computer science , programming language , chromatography
A structural refinement of ammonium hydrogen tartrate, C 4 H 9 NO 6 , has been completed from data obtained on an Enraf–Nonius CAD‐4 X‐ray diffractometer equipped with a Si(Li) solid‐state detector. The refinement has given comparable results with those found in the literature. A comparative study of a select number of weak reflections obtained from this study and from the results of an analysis using a conventional scintillation system indicates that the peak‐to‐background ratio is better for intensity data collected on an X‐ray diffractometer using a Si(Li) solid‐state detector system. An important application of a Si(Li) energy‐dispersive system is X‐ray fluorescence analysis which can be performed on the same single‐crystal employed in X‐ray diffraction data collection. Qualitative determinations and quantiative data on relative percentages of metal constituents have been obtained from single crystals of Lu(OH) 3 and Mn 3 [Co(CN) 6 ] 2 .12H 2 O in less than two hours.