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Profile analysis of diffractometer data
Author(s) -
Lindqvist O.,
Ljungström E.
Publication year - 1979
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889879011973
Subject(s) - diffractometer , ibm , crystallography , mineralogy , mathematics , geology , physics , chemistry , optics , crystal structure
A computer program has been written for the evaluation of integrated intensities from X‐ray diffractometer data. It has been compiled for IBM 360/65 and HP 2100A. The Lehmann–Larsen profile‐analysis method [Lehmann & Larsen (1974). Acta Cryst. A 30 , 580–584] has been used. For weak reflections, profiles obtained from well defined, neighbouring reflections are employed.