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Small‐angle X‐ray data processing for planar multilayered structures. I. Theory
Author(s) -
Worthington C. R.,
Wang S. K.
Publication year - 1979
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889879011742
Subject(s) - divergence (linguistics) , curvature , optics , fourier transform , planar , x ray , physics , allowance (engineering) , transverse plane , beam (structure) , geometry , reflection (computer programming) , structure factor , materials science , computational physics , mathematics , nuclear magnetic resonance , quantum mechanics , mechanical engineering , philosophy , linguistics , computer graphics (images) , structural engineering , computer science , programming language , engineering
The Fourier transform values are obtained by multiplying the integrated intensities by the correction factor C ( h ). The problem of calculating the correction factor for biological specimens which have a multilayered structure is treated. Allowance is made for the transverse size of the specimen, the disorientation in the specimen ( ω ), the divergence of the X‐ray beam ( ɛ ), the size of the repeating unit and the curvature of the sphere of reflection. The correction factor C ( h ) is given by C ( h ) = Ω [1 + 2 γh 2 ] 1/2 exp ( πδ 2 )exp (− Ω 2 [1 + 2 γh 2 ]), where γ = ( ω 2 + ɛ 2 )/2( Ω 2 d 2 ) and where Ω is the diameter of the h th order disc when ω = ɛ = 0. The formula for C ( h ) applies to specimens which remain stationary during the X‐ray experiment.