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X‐ray beam polarization measurements
Author(s) -
Le Page Y.,
Gabe E. J.,
Calvert L. D.
Publication year - 1979
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889879011705
Subject(s) - monochromator , optics , polarization (electrochemistry) , detector , physics , beam (structure) , full width at half maximum , principal axis theorem , polarimeter , materials science , chemistry , geometry , mathematics , scattering , polarimetry , wavelength
A simple modification of the jig proposed by the IUCr Commission on Crystallographic Apparatus for the measurement of polarization ratios for X‐rays allowing the full rotation of the detector arm permits cancellation of the first‐order errors by averaging pairs of measurements differing by 180° around the rotation axis of the detector arm. The plot of I meas as a function of cos 2 Φ , where Φ is the angle between the detector arm and one of the principal directions of polarization in the beam gives a reliable value of the polarization ratio K . The experimental results are: Mo Kα 0.969 ± 3, 0.970 ± 3; Cu Kα 0.908 ± 5, 0.897 ± 5 for a 0.42° and a 0.60° FWHM graphite monochromator respectively.