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Correction de temps mort des raies de diffraction X
Author(s) -
Rigoult J.
Publication year - 1979
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889879011687
Subject(s) - diffraction , gaussian , optics , physics , crystal (programming language) , crystallography , materials science , chemistry , computer science , quantum mechanics , programming language
A formula giving the correction for counting losses due to the dead‐time effect in single‐crystal X‐ray diffractometry has been obtained by least‐squares fit of theoretical formulae with either a Gaussian or a Lorentzian doublet taken as the shape of the diffraction peaks. The fit has been achieved with corrected data obtained for three different crystal types by step scanning. It is shown that this correction, easily applicable during the data reduction, is quantitatively satisfying and is necessary for any study in accurate X‐ray crystallography.