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Small‐angle electron scattering in the transmission electron microscope
Author(s) -
Carpenter R. W.,
Bentley J.,
Kenik E. A.
Publication year - 1978
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889878013886
Subject(s) - electron , optics , brightness , electron microscope , scattering , scanning transmission electron microscopy , energy filtered transmission electron microscopy , resolution (logic) , transmission electron microscopy , conventional transmission electron microscope , microscope , diffraction , electron scattering , materials science , angular resolution (graph drawing) , transmission (telecommunications) , high resolution transmission electron microscopy , physics , mathematics , computer science , nuclear physics , telecommunications , combinatorics , artificial intelligence
Two methods for performing small‐angle electron scattering (SAES) experiments in transmission electron microscopes are described: the long‐camera‐length method and the selected‐area‐diffraction method. It is shown experimentally that angular resolutions of a few microradians and a few tenths of milliradians, respectively, are easily obtained by these two methods. A number of examples of the application of SAES to problems in materials science are presented. The use of new high‐brightness electron sources is expected to produce significant increases in angular resolution, and the use of electron‐energy analyzers will permit the separation of most of the inelastic contribution to the SAES intensity distribution.