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A new measuring procedure for data collection with a high‐pressure cell on an X‐ray four‐circle diffractometer
Author(s) -
Denner W.,
Schulz H.,
D'Amour H.
Publication year - 1978
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s002188987801328x
Subject(s) - diffractometer , reciprocal lattice , reciprocal , reflection (computer programming) , position (finance) , measure (data warehouse) , systematic error , optics , range (aeronautics) , pressure measurement , observational error , materials science , physics , mathematics , computer science , diffraction , database , statistics , scanning electron microscope , linguistics , philosophy , finance , meteorology , economics , composite material , programming language
From single crystals contained in a high‐pressure device, only reflection intensities in a greatly restricted range of reciprocal space can be measured. Many of these intensities may be strongly influenced by systematic errors due to the high‐pressure device, if the standard measuring procedures of a four‐circle diffractometer are used. These procedures measure intensities only in the bisecting position. The development of a new `high‐pressure' measuring procedure is reported, which allows automatic measurement of reflection intensities in the greatest possible areas of reciprocal space and correction in the data‐collection procedure for the systematic errors due to the high‐pressure cell. This means that the intensity data obtained with this procedure can be analysed with the common programs for structure investigation.