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A universal high‐temperature device for single‐crystal diffraction
Author(s) -
Tuinstra F.,
Fraase Storm G. M.
Publication year - 1978
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889878013278
Subject(s) - goniometer , coaxial , diffractometer , diffraction , crystal (programming language) , materials science , single crystal , optics , head (geology) , crystallography , physics , chemistry , electrical engineering , composite material , computer science , engineering , geology , scanning electron microscope , geomorphology , programming language
The construction of a heating device for single‐crystal diffraction is presented. The device operates with two coaxial gas streams, the central one of which is electrically heated by means of a resistance wire. As a result the crystal temperature is not affected by external factors such as flowing air etc . Temperatures up to 1000 K can be reached and maintained to within 1 K for extended periods. The device fits on a standard goniometer head and can, without any special options, be installed on any single‐crystal diffractometer or camera.