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High‐speed X‐ray analysis
Author(s) -
Ayers G. L.,
Huang T. C.,
Parrish W.
Publication year - 1978
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889878013217
Subject(s) - diffractometer , electron microprobe , optics , diffraction , analytical chemistry (journal) , wavelength , range (aeronautics) , materials science , x ray fluorescence , microprobe , crystal (programming language) , intensity (physics) , powder diffraction , powder diffractometer , x ray crystallography , fluorescence , crystallography , chemistry , physics , scanning electron microscope , mineralogy , computer science , chromatography , metallurgy , composite material , programming language
The profile‐fitting method was used to analyze data, collected at speeds up to 1° (2 θ ) per second with a computer‐controlled diffractometer, which gave precise values of intensities and angles of reflections above a selected intensity threshold level. Powder diffraction data with 52 reflections in a 40° range were collected and analyzed in a few minutes. This technique has also been applied to X‐ray fluorescence spectroscopy, and is applicable to single‐crystal diffractometry and wavelength‐dispersive electron microprobe analysis.

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