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Energy‐dispersive powder profile refinement using synchrotron radiation
Author(s) -
Glazer A. M.,
Hidaka M.,
Bordas J.
Publication year - 1978
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889878013060
Subject(s) - synchrotron radiation , synchrotron , beamline , detector , high energy x rays , materials science , sample (material) , radiation , computational physics , solid state , energy (signal processing) , optics , line (geometry) , physics , mathematics , geometry , engineering physics , beam (structure) , quantum mechanics , thermodynamics
Results of powder‐profile refinement using a solid‐state detector with synchrotron radiation are presented. The data are collected very rapidly and the usual structural parameters are refined together with line‐shape, zero error and instrument function. The results are in excellent agreement with previously published parameters. The rapidity and precision of the method means that it will be possible in the near future to find structural parameters of a powdered material in a few s or min and thus allow simultaneous structure refinement with changing sample environment.