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Optimum resolution in X‐ray energy‐dispersive diffractometry
Author(s) -
Buras B.,
Niimura N.,
Olsen J. S.
Publication year - 1978
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s002188987801290x
Subject(s) - resolution (logic) , optics , range (aeronautics) , scattering , x ray , energy (signal processing) , detector , divergence (linguistics) , physics , materials science , computational physics , linguistics , philosophy , quantum mechanics , artificial intelligence , computer science , composite material
The resolution problem in X‐ray energy‐dispersive diffractometry is discussed. It is shown that for a given characteristic of the solid‐state detector system and a given range of interplanar spacings, an optimum scattering angle can be easily found for any divergence of the incident and scattered beams.