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Smoothing and validity of crystallite‐size distributions from X‐ray line‐profile analysis
Author(s) -
Le Bail A.,
Louër D.
Publication year - 1978
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889878012662
Subject(s) - crystallite , smoothing , spurious relationship , consistency (knowledge bases) , line (geometry) , materials science , mathematics , analytical chemistry (journal) , mineralogy , statistics , chemistry , geometry , chromatography , metallurgy
A smoothing procedure is described which eliminates spurious details on crystallite‐size distribution functions deduced from X‐ray line profiles. It is based on a least‐squares process with a stabilization scheme and is applied to composite specimens prepared by mixing known quantities of samples of nickel hydroxide, whose crystallite size‐distribution functions were previously determined. Calculated and observed distributions and average sizes are compared. The results are reasonably good and show the self‐consistency of the method.