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A rapid method for analysing the breadths of diffraction and spectral lines using the Voigt function
Author(s) -
Langford J. I.
Publication year - 1978
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889878012601
Subject(s) - voigt profile , cauchy distribution , diffraction , convolution (computer science) , crystallite , function (biology) , representation (politics) , gaussian , absorption (acoustics) , emission spectrum , spectral line , computational physics , materials science , physics , analytical chemistry (journal) , statistical physics , mathematical analysis , mathematics , chemistry , optics , crystallography , computer science , quantum mechanics , chromatography , machine learning , evolutionary biology , politics , artificial neural network , law , political science , biology
The Voigt function provides a rapid and easily applied method for interpreting the breadths of diffraction profiles in terms of specimen defects and for studying absorption or emission spectra. In the past, approximate methods have usually involved the assumption that the constituent profiles are either Cauchy (Lorentzian) or Gaussian, but a better representation of the experimental data is given by the convolution of these functions. The method is illustrated by analysis of the Cu Kα emission profile and of crystallite‐size broadening in nickel powder.