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Correction des aberrations instrumentales: critères expérimentaux pour l'utilisation des méthodes de déconvolution
Author(s) -
Croche R.,
Gatineau L.
Publication year - 1977
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889877014009
Subject(s) - deconvolution , convolution (computer science) , optics , physics , line (geometry) , sample (material) , goniometer , mathematics , computer science , geometry , artificial intelligence , artificial neural network , thermodynamics
The correction of instrumental aberration influencing the shape of diffraction lines requires the use of deconvolution processes. Practically, when the half‐height line width of the defect functions is not larger than one sixth of the line to be analysed, deconvolution is useless. The deconvolution processes can be easily performed when the width of the defect functions remains smaller than half the line width. For the two rules, graphs are presented that allow one to predict the adequate slit width and the sample thickness used on a X‐ray goniometer.