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A pattern‐recognition procedure for scanning oscillation films
Author(s) -
Kabsch W.
Publication year - 1977
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889877013892
Subject(s) - spots , oscillation (cell signaling) , search engine indexing , diffraction , pattern recognition (psychology) , optics , materials science , computer science , artificial intelligence , physics , chemistry , biochemistry
A pattern‐recognition procedure has been developed which directly locates and integrates all diffraction spots on a given oscillation film. Indexing of all identified spots is carried out subsequently, together with the refinement of the relevant parameters.