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The separation of K α 1 and K α 2 components in X‐ray line profile analysis
Author(s) -
Narayan R.
Publication year - 1977
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889877013600
Subject(s) - line (geometry) , separation (statistics) , x ray , physics , materials science , analytical chemistry (journal) , mathematics , chemistry , optics , geometry , statistics , chromatography
The measured profile is written as a set of linear equations in terms of the `true profile'. These equations are solved by least squares. The method is stable and gives good results when the end‐points of the calculated profile are fixed at their known value of zero. A comparison shows that the present method is competitive with the other methods currently employed.