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Dislocation contrast in X‐ray synchrotron topographs
Author(s) -
Tanner B. K.,
Midgley D.,
Safa M.
Publication year - 1977
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889877013491
Subject(s) - burgers vector , dislocation , synchrotron radiation , contrast (vision) , x ray , optics , synchrotron , materials science , orientation (vector space) , crystallography , physics , condensed matter physics , geometry , chemistry , mathematics
The contrast of dislocations in X‐ray topographs taken in the Guinier–Tennevin mode with synchrotron radiation has been studied. In reflections where high orders were insignificant, dislocation images appeared very similar to those in Lang topographs taken with characteristic radiation. At large specimen‐to‐plate distances orientation contrast is important in the direct image. The sense of the Burgers vector of dislocations showing double contrast can be deduced.