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Equipping a four‐circle single‐crystal diffractometer with an interchangeable Si(Li) solid‐state detector
Author(s) -
Grant D. F.,
Lisher E. J.,
Mitchell R. H.
Publication year - 1977
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889877013235
Subject(s) - detector , diffractometer , scintillation , scintillator , scintillation counter , optics , reproducibility , solid state , materials science , resolution (logic) , physics , noise (video) , single crystal , solid angle , analytical chemistry (journal) , chemistry , nuclear magnetic resonance , computer science , scanning electron microscope , engineering physics , artificial intelligence , chromatography , image (mathematics)
A Siemens AED four‐circle diffractometer has been fitted with a Si(Li) solid‐state detector (SSD) interchangeably with a scintillation detector in such a way that the whole 25 kg SSD package is driven by the 2θ arm with no more strain or stepping errors than are experienced with the scintillation detector. Better energy resolution (elimination of λ/2 without significant intensity loss) and lower background noise, as compared with those of a scintillation counter, are obtained. The reproducibility of the TDS measurements made with this SSD system is within counting statistics.