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Intensity measurements of twinned or grown‐together crystals on single‐crystal diffractometers
Author(s) -
Denner W.,
D'Amour H.,
Schulz H.,
Stoeger W.
Publication year - 1977
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889877013193
Subject(s) - intensity (physics) , detector , optics , materials science , crystal (programming language) , aperture (computer memory) , single crystal , crystallography , physics , chemistry , computer science , acoustics , programming language
The overlapping of reflections during the intensity measurement of a polycrystal (grown‐together single crystals) can be checked by formulae given in this paper. These formulae are based on scan mode, scan width and detector aperture.