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An automated procedure for the correction of background due to inelastic scattering in electron diffraction patterns
Author(s) -
Fraser R. D. B.,
Macrae T. P.,
Suzuki E.,
Tulloch P. A.
Publication year - 1977
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889877012837
Subject(s) - diffraction , inelastic scattering , electron diffraction , scattering , electron , optics , materials science , electron backscatter diffraction , physics , computational physics , nuclear physics
The use of electron diffraction in structural studies of fibrous polymers is complicated by the presence of an intense background associated with inelastic scattering. A method of digital processing is described which effectively removes the undesirable features of this background. The method is also applicable in low‐angle X‐ray diffraction studies.