Recording of electron‐diffraction patterns of radiation‐sensitive materials in the high‐voltage electron microscope with luminescent radiographic screens | Zendy

King M. V. | Zendy; Parsons D. F. | Zendy

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Recording of electron‐diffraction patterns of radiation‐sensitive materials in the high‐voltage electron microscope with luminescent radiographic screens

Author(s) -

King M. V.,

Parsons D. F.

Publication year - 1977

Publication title -

journal of applied crystallography

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.429

H-Index - 162

ISSN - 1600-5767

DOI - 10.1107/s0021889877012825

Subject(s) - materials science , luminescence , electron microscope , photographic emulsion , optics , electron , radiation , scanning electron microscope , diffraction , acceleration voltage , luminescent measurements , resolution (logic) , microscope , optoelectronics , biological specimen , cathode ray , nanotechnology , physics , layer (electronics) , quantum mechanics , artificial intelligence , computer science , silver halide

An effective method for greatly reducing the electron exposure of radiation‐sensitive organic or biological specimens while recording their diffraction patterns in a high‐voltage (MeV range) electron microscope is described. It involves recording on double‐coated screen‐type medical X‐ray film and backing it with a luminescent radiographic screen which intercepts the transmitted electrons and emits visible light that exposes the bottom emulsion of the film. Values of sensitivity, resolution, and enhancement ratio are tabulated: the latter values range up to 41. Typical patterns taken with l ‐valine are shown.

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