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Structure of TiN x studied by electron diffraction and microscopy
Author(s) -
Nagakura S.,
Kusunoki T.
Publication year - 1977
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889877012795
Subject(s) - tin , tetragonal crystal system , crystallography , crystal structure , electron diffraction , atom (system on chip) , diffraction , materials science , lattice (music) , electron microscope , stoichiometry , chemistry , physics , optics , metallurgy , computer science , acoustics , embedded system
The crystal and internal structures of the non‐stoichiometric compound TiN x ( x = 0.61~0.999, δ‐phase, NaCl type) have been studied by electron diffraction and microscopy. In general, interstitial N atoms produce only short‐range order, but in TiN 0.61 there is long‐range order after aging at 500°C for one or three months. The ordered structure is tetragonal with lattice parameters a = 4.198 Å < a 0 , and c = 8.591 Å > 2 a 0 ( a 0 = 4.221 Å: lattice parameter of disordered TiN 0.61 ), and belongs to the space group I 41/ amd with the atom positions 8 Ti at 8( e ) with z = ¼+0.018, 4 N at 4( a ) and 0.88 N at 4( b ). The ordered regions develop from small isolated regions and coalesce gradually with aging. The resulting structure contains antiphase and semi‐antiphase domain boundaries with respect to the N atom arrangement. The appearance of the semi‐antiphase domain boundaries is due to the structure being able to have both 4 1 and 4 3 screw axes. The structural difference between TiN x and γ (or ɛ)‐Ti 2 N is also discussed.