Premium
Least‐squares structure refinement based on profile analysis of powder film intensity data measured on an automatic microdensitometer
Author(s) -
Malmros G.,
Thomas J. O.
Publication year - 1977
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889877012680
Subject(s) - microdensitometer , rietveld refinement , crystal (programming language) , reproducibility , intensity (physics) , single crystal , reflection (computer programming) , standard deviation , materials science , crystal structure , crystallography , optics , chemistry , mathematics , physics , computer science , statistics , programming language
The Rietveld profile‐analysis refinement procedure [Rietveld, J. Appl. Cryst. (1969), 2 , 65–71] is here applied to microdensitometer‐measured Guinier–Hägg X‐ray powder film data (strictly monochromated Cu K α 1 radiation). Various functions for describing the profile form of an individual reflection are tested; the most satisfactory fit is obtained for a modified and asymmetrized Lorentz function. The crystal structure of α‐Bi 2 O 3 has been refined and no significant deviations are observed from the results of an earlier single‐crystal study [Malmros, Acta Chem. Scand . (1970), 24 , 384–396]. An R F value [roughly comparable with the conventional R ( F ) value of single‐crystal work] of 0.068 was obtained, with standard deviations on the refined positional parameters on average three times larger than those obtained from the single‐crystal study. Further examples of the refinement technique are also given which illustrate both its reproducibility and range of application.