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Absolute structure‐factor measurements in imperfect single crystals by means of γ‐ray diffractometry
Author(s) -
Schneider J. R.
Publication year - 1976
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889876011692
Subject(s) - bar (unit) , structure factor , diffraction , scattering , bragg's law , x ray , atomic number , materials science , thermal , optics , atomic physics , physics , chemistry , crystallography , thermodynamics , meteorology
An experimental method of measuring absolute structure factors in imperfect single crystals by means of Bragg diffraction of 0.03 Åγ‐radiation is presented. It is shown that in principle atomic scattering factors can be deduced with an accuracy of about ±0.5% from rocking curves measured by means of γ‐ray diffractometry. Due to the uncertainties in the correction for thermal motion of the atoms, however, the values of the atomic scattering factors of copper at the 220, 22 and 333 reflexions could be derived only with an accuracy of ±1%. The measurements were made at room temperature.