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Méthode d'indexation rapide des diagrammes de diffraction électronique en réflexion de la face (00.1) de cristaux hexagonaux
Author(s) -
Bessières J.,
Heizmann J. J.,
Baro R.
Publication year - 1976
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889876011461
Subject(s) - diffraction , electron diffraction , trigonal crystal system , hexagonal crystal system , lattice (music) , materials science , crystallography , physics , optics , chemistry , crystal structure , acoustics
A method is described for the rapid indexing of (00.1) electron diffraction diagrams obtained from materials having trigonal or hexagonal symmetry. When the substance is known it is possible to determine the azimuthal orientation of the sample. A second diffraction diagram allows the determination of the lattice parameters of the substance when it is unknown.