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Lattice‐parameter measurement technique for single crystals using two lattice planes, and its application to Gd 3 Ga 5 O 12 single crystals
Author(s) -
Isomae S.,
Kishino S.,
Takagi K.,
Ishii M.,
Maki M.
Publication year - 1976
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s002188987601145x
Subject(s) - lattice (music) , monochromatic color , lattice constant , materials science , single crystal , optics , condensed matter physics , crystallography , physics , diffraction , chemistry , acoustics
A lattice‐parameter measurement technique using two lattice planes and monochromatic X‐ray beams has been investigated. Accuracy, measurement correction and extensions of the technique are discussed. With this technique, the lattice parameters of Gd 3 Ga 5 O 12 , single crystals, grown under different conditions, have been measured to an accuracy of ±0.0003 Å. From the results obtained for Gd 3 Ga 5 O 12 , single crystals, it has been found that the technique has several advantages in comparison with conventional methods.