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The detection of small differences in lattice constant at low temperature by an energy‐dispersive X‐ray diffractometer
Author(s) -
Nakajima T.,
Fukamachi T.,
Terasaki O.,
Hosoya S.
Publication year - 1976
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889876011370
Subject(s) - cryostat , diffractometer , lattice constant , lattice (music) , constant (computer programming) , powder diffractometer , materials science , analytical chemistry (journal) , optics , condensed matter physics , chemistry , physics , crystallography , diffraction , crystal structure , chromatography , superconductivity , computer science , programming language , acoustics
A cryostat has been designed for an energy‐dispersive X‐ray diffractometer so that the specimen can be measured between 1.48 K and room temperature. Three powder samples can successively be measured at a fixed temperature by rotating the cryostat in steps of 120°. This design is very suitable particularly for detecting a slight change or difference, if any, in lattice constant among samples. A typical example is described of detecting the difference in lattice constant between 92 Mo and 100 Mo.