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On the criterion of equal intensities in a high‐precision Laue method for crystal orientation
Author(s) -
Gerward L.
Publication year - 1976
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889876011084
Subject(s) - orientation (vector space) , crystal (programming language) , surface (topology) , optics , physics , materials science , computational physics , geometry , mathematics , computer science , programming language
The influence of the crystal surface orientation on the intensities of X‐ray reflexions in Laue patterns is investigated in the kinematical approximation as well as in the framework of the dynamical theory. The results are used to discuss the limitation of the criterion of equal intensities in a high‐precision method for crystal orientation.